5962-9679801VCA Datasheet, PDF (1/25 Pages) Texas Instruments – LM119QML High Speed Dual Comparator

LM119QML
www.ti.com
SNOSAN3B – JULY 2008 – REVISED MARCH 2013
LM119QML High Speed Dual Comparator
Check for Samples: LM119QML
FEATURES
1
•2 Available with radiation ensured
– High Dose Rate 100 krad(Si)
– ELDRS Free 100 krad(Si)
• Two independent comparators
• Operates from a single 5V supply
• Typically 80 ns response time at ±15V
• Minimum fan-out of 2 each side
• Maximum input current of 1 μA over
temperature
• Inputs and outputs can be isolated from
system ground
• High common mode slew rate
DESCRIPTION
The LM119 is a precision high speed dual
comparator fabricated on a single monolithic chip. It
is designed to operate over a wide range of supply
voltages down to a single 5V logic supply and
ground. Further, it has higher gain and lower input
currents than devices like the LM710. The
uncommitted collector of the output stage makes the
LM119 compatible with RTL, DTL and TTL as well as
capable of driving lamps and relays at currents up to
25 mA.
Although designed primarily for applications requiring
operation from digital logic supplies, the LM119 is
fully specified for power supplies up to ±15V. It
features faster response than the LM111 at the
expense of higher power dissipation. However, the
high speed, wide operating voltage range and low
package count make the LM119 much more versatile
than older devices like the LM711.
Connection Diagrams
CDIP Package
LCCC Package
Figure 1. Top View
Package Number J0014A
TO-100 Package
N/C N/C N/C N/C N/C
GND 1
N/C
IN+ 1
N/C
IN- 1
3
4
5
6
7
8
9
2
1
20
19
18
17
16
15
14
10
11
12
13
OUTPUT 1
N/C
V+
N/C
IN- 2
V- _{OUTPUT 2} N/C GND 2 IN+ 2
Figure 2. Top View
Package Number NAJ0020A
Case is connected to pin 5 (V^−).
Figure 3. Top View
Package Number LME0010C
Figure 4. Top View
Package Number NAD0010A, NAC0010A
1
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2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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