U3770M Datasheet, PDF (3/5 Pages) TEMIC Semiconductors – CT2 I/Q Modulator and Clock Circuitry

U3770M
Absolute Maximum Ratings
Stresses at or above those listed may cause permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in this data sheet is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Parameters
Supply voltage
Modulator input voltages
Reference frequency input
Ambient temperature
Storage temperature
Junction temperature
Operating Range
Symbol
Value
Unit
V_DD
6
V
I
IB
–0.5 to V_DD
V
Q
QB
F_{Ref in}
–0.5 to V_DD
V
T_amb
–40 to +85
°C
T_stg
–65 to +150
°C
T_j
T_j < T_amb +10
°C
Supply voltage
Ambient temperature
Junction temperature
Storage temperature
Parameters
Symbol
V_DD
"^Value
3 10%
Unit
V
T_amb
–5 to +70
°C
T_j
T_j < T_amb +5
°C
T_stg
–40 to +125
°C
Electrical Characteristics
Test conditions (unless otherwise specified) related to test circuit
V_S = 3 V, V_BIi, V_BIi and V_BQi, V_BQi = 1 V_PP single ended, oscillator frequency F_{Ref in} = 12.8 MHz, T_amb = –5 to +70°C
Parameters
Supply voltage range
Supply current
F_{Ref in}
Input voltage
Input impedance
I, Q inputs
Input voltage
Input impedance
Input frequency
External bias voltage
MOD_out
Output level ¹⁾
LO and sideband suppres-
sion
Output impedance
CLK_out
Output frequency
Output voltage swing
Test Conditions / Pins
Pin 3
Pin 3
Pin 2
Pins 5, 6, 7 and 8
Single ended
Single ended
Unloaded
Pin 9
Pin 14
@ load = 20 pF
Symbol
V_DD
I_DD
V_{F Ref in}
Z_{F Ref in}
V_{Iin, Qin}
Z_{Iin, Qin}
F_{Iin, Qin}
V_{IB, QB}
V_{Mod out}
LO sub
SB sub
Z_{Mod out}
F_{CLK out}
V_{CLK out}
Min.
2.7
150
100
1.8
Typ.
3
4
1
20
18
1.5
70
–26
5
18.432
Max.
Unit
3.3
V
mA
W mVPP
k
W^VPP
k
kHz
V
mVRMS
dBc
kW
MHz
V
Note ¹⁾ The output signal contains some harmonics, to be filtered by an external low-pass filter
MATRA MHS
3 (5)
Rev. A2, 03-Dec-97