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PHT64020B Datasheet, PDF (2/2 Pages) Teledyne Technologies Incorporated – Up to 6 GHz Linear Power Silicon Bipolar Transistor
Electrical Specifications [1]
Symbol Parameters and Test Conditions
P1dB
Power Output @ 1 dB Gain Compression
VCE = 16V, Ic = 110 mA, f = 2.0 GHz
G1dB
1 dB Compression Gain
VCE = 16V, Ic = 110 mA, f = 2.0 GHz
hFE
Forward Current Transfer Ratio; VCE = 8 V, IC = 110mA
ICBO
Collector Cutoff Current; VCE = 16
IEBO
Emitter Cutoff Current; VEB = 1 V
NOTE:
1. ηT = (RF Output Power) / (RF Input Power + V ICE C).
-55°C
+25°C
+150°C
Units Min Max Min Max Min Max
dBm
26.0
dB
8.5
--
15
µA
µA
20 200
100
5.0
1000
TMS UpScreen
Screening Test/Operation
Temperature Cycling
Constant Acceleration
High Temp. Reverse Bias
(HTRB)
Interim Electrical Tests
Table 1A 100% Screening
MIL-STD-750
Conditions
Method
1051
Condition C, Ta = -55°C to 175°C
20 cycles minimum
2006
20,000G, Y1 axis only,
1 min. hold does not apply
1039
Condition A, t= 48 hrs., Ta = +150 °C
VCB= 80% of rated BVCBO
------
+25°C; hFE, ICBO IEBO
Power Burn-in
Final Electrical Test
Group A, Subgroup 2
Delta Limits
Percent Defective Allowable
(PDA)
Hermeticity - Fine Leak
- Gross Leak
External Visual
1039
------
------
------
1071
1071
2071
Condition B, t= 160 hrs., Ta = +25°C,
Tj = +150°C
+25°C; hFE, ICBO IEBO
∆hFE = ±25%
∆ICBO = ±50 nA or ±100%,
whichever is greater
10% maximum applies to
Final Electrical and Deltas
Condition H1
Condition C or K
Group A Inspection
Subgroup1, Sample 22/0
Subgroup 3, Sample = 116/0
Subgroup 4, Sample = 116/0
Subgroup 5, 6 & 7 are not applicable
Marking - Dot units near pin 1
Shipment Packaging
------
Subgroup 1, Visual Mechanical
Subgroup 3, hFE @ -55°C, ICBO @ +150°C
Subgroup 4, P1dB & G1dB @ +25°C
(blue) unless directed otherwise
10 per strip
Marking: Manufacturer’s marking (if applicable) will remain on devices. TMS individual packaging will be
labeled with TMS Part Number and manufacturer date code. TMS shipment date code will appear on outer
label and C of C. Certificate of Conformance (C of C) will be sent with each shipment. This document provides
objective evidence of TMS testing and documents traceability to manufacturers wafer/lot identification.
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Specifications subject to change without notice.
PHT-64020B