STB6N80K5 Datasheet, PDF (9/26 Pages) STMicroelectronics – Zener-protected

STB6N80K5, STD6N80K5, STI6N80K5, STP6N80K5
3
Test circuits
Test circuits
Figure 16. Switching times test circuit for
VD
VGS
RG
PW
RL
2200
μF
D.U.T.
3.3
μF _VDD
resistive load
AM01468v1
Figure 17. Gate charge test circuit
VDD
12V
47kΩ
1kΩ
100nF
Vi=20V=VGMAX
2200
μF
IG=CONST
2.7kΩ
100Ω
D.U.T.
VG
47kΩ
PW
1kΩ
AM01469v1
Figure 18. Test circuit for inductive load
switching and diode recovery times
Figure 19. Unclamped inductive load test circuit
G
25 Ω
A
D
D.U.T.
S
B
AA
FAST
DIODE
L=100μH
B
3.3
B
μF
D
G
RG
S
1000
μF
VDD
Vi
L
VD
2200
3.3
μF
μF
VDD
ID
D.U.T.
AM01470v1
Figure 20. Unclamped inductive waveform
V(BR)DSS
VD
Pw
AM01471v1
Figure 21. Switching time waveform
ton
toff
tdon
tr
tdoff tf
VDD
IDM
ID
0
VDD
90%
10% VDS
90%
VGS
90%
10%
AM01472v1
0
10%
AM01473v1
DocID024661 Rev 3
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