SD2931-12MR Datasheet, PDF (9/16 Pages) STMicroelectronics – Excellent thermal stability

SD2931-12MR
4.1.1 Test circuit (175 MHz)
Typical performance
Figure 15: 175 MHz test circuit schematic (production test circuit)
V_G
+50V
Component
T1
T2
FB1
FB2, FB3
FB4
L1
PCB
R1, R3
R2
R4
R5
C1, C11
C2
C3, C8, C9
C4
C5
C6
C7
C10
C12, C15
C13, C14,C16,
C17
C18
Table 7: 175 MHz test circuit part list
Description
4:1 transformer, 25 Ω flexible coax .090 OD 6” long
1:4 transformer, 25 Ω semi-rigid coax .141 OD 6” long
Toroid X 2, 0.5” OD .312” ID 850 µ 2 turns
VK200
Shield bead, 1” OD 0.5” ID 850 µ 3 turns
1/4 wave choke, 50 Ω semi-rigid coax .141 OD 12” long
0.62” woven fiberglass, 1 oz. copper, 2 sides, εr = 2.55
470 Ω 1 W chip resistor
360 Ω 1/2 W resistor
20 kΩ 10 turn potentiometer
560 Ω 1 W resistor
470 pF ATC chip cap
43 pF ATC chip cap
Arco 404, 12-65 pF
Arco 423, 16-100 pF
120 pF ATC chip cap
0.01 µF ATC chip cap
30 pF ATC chip cap
91 pF ATC chip cap
1200 pF ATC chip cap
0.01 µF / 500 V chip cap
10 µF 63 V electrolytic capacitor
DocID023650 Rev 3
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