SD2931-12MR Datasheet, PDF (12/16 Pages) STMicroelectronics – Excellent thermal stability

Typical performance
4.2.1 Test circuit (30 MHz)
SD2931-12MR
Figure 23: 30 MHz test circuit schematic (production test circuit)
V_G+
+50V
Component
T1
T2
FB1
FB2
FB3
RFC1
PCB
R1, R3
R2
C1, C4, C6, C7, C8,
C9, C11, C12,C13
C2, C3
C5
C10
C14
Table 8: 30 MHz test circuit part list
Description
9:1 transformer, 25 Ω flexible coax with extra shield .090 OD 15” long
1:4 transformer, 50 Ω flexible coax .225 OD 15” long
Toroid 1.7” OD .30” ID 220 µ 4 turns
Surface mount EMI shield bead
Toroid 1.7” OD .300” ID 220 µ 3 turns
Toroid 0.5” OD 0.30” ID 125 µ 4 turns 12 awg wire
0.62” woven fiberglass, 1 oz. copper, 2 sides, εr = 2.55
1 kohm 1 W chip resistor
680 ohm 3 W wirewound resistor
0.1 μF ATC chip cap
750 pF ATC chip cap
470 pF ATC chip cap
10 μF 63 V electrolytic capacitor
100 μF 63 V electrolytic capacitor
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DocID023650 Rev 3