CD00297243 Datasheet, PDF (8/14 Pages) STMicroelectronics – Dual N-channel 30 V, 0.016 ohm typ., 11 A STripFET

Test circuits
3
Test circuits
STL40DN3LLH5
Figure 12. Switching times test circuit for
resistive load
Figure 13. Gate charge test circuit
VDD
VD
VGS
RG
PW
RL
2200
μF
D.U.T.
3.3
μF _VDD
12V
47kΩ
1kΩ
100nF
Vi=20V=VGMAX
2200
μF
IG=CONST
2.7kΩ
100Ω
D.U.T.
VG
47kΩ
PW
AM01468v1
1kΩ
AM01469v1
Figure 14. Test circuit for inductive load
Figure 15. Unclamped inductive load test
switching and diode recovery times
circuit
G
25 Ω
A
D
D.U.T.
S
B
AA
FAST
DIODE
L=100μH
B
3.3
B
μF
D
G
RG
S
1000
μF
VDD
Vi
L
VD
2200
3.3
μF
μF
VDD
ID
D.U.T.
Pw
AM01470v1
AM01471v1
Figure 16. Unclamped inductive waveform
V(BR)DSS
VD
Figure 17. Switching time waveform
ton
tdon
tr
toff
tdoff tf
VDD
IDM
ID
0
VDD
90%
10% VDS
90%
VGS
90%
10%
AM01472v1
0
10%
AM01473v1
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Doc ID 18416 Rev 3