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74LCX74_06 Datasheet, PDF (7/17 Pages) STMicroelectronics – Low voltage CMOS dual D-Type Flip Flop with 5V tolerant inputs
74LCX74
Electrical characteristics
Table 7. AC electrical characteristics
Test condition
Symbol
Parameter
VCC
CL
RL
(V)
(pF)
(Ω)
Propagation delay 2.7
tPLH tPHL time (CK to Q or
Q)
3.0 to 3.6
50
500
Propagation delay 2.7
tPLH tPHL time (PR or CLR
to Q or Q)
3.0 to 3.6
50
500
Setup time, HIGH
2.7
tS
or LOW level D to
50
500
CK
3.0 to 3.6
Hold time, HIGH
2.7
th
or LOW level D to
CK
3.0 to 3.6
50
500
CK Pulse width,
2.7
tW
HIGH or LOW
PR or CLR Pulse 3.0 to 3.6
50
500
Width, LOW
trec
Recovery time PR
2.7
or CLR to CK
3.0 to 3.6
50
500
ts = tr
(ns)
2.5
2.5
2.5
2.5
2.5
2.5
Value
-40 to 85 °C Unit
Min Max
1.5 8.0
ns
1.5 7.0
1.5 8.0
ns
1.5 7.0
2.5
ns
2.5
1.5
ns
1.5
3.0
ns
3.0
0
ns
0
fMAX
Clock pulse
frequency
2.7
50
500
2.5
150
MHz
tOSLH
tOSHL
Output to output
skew time (1) (2)
3.0 to 3.6
50
500
2.5
1.0 ns
1. Skew is defined as the absolute value of the difference between the actual propagation delay for any two
outputs of the same device switching in the same direction, either HIGH or LOW (tOSLH = | tPLHm - tPLHn|,
tOSHL = | tPHLm - tPHLn|)
2. Parameter guaranteed by design
Table 8. Capacitive characteristics
Test condition
Symbol
Parameter
VCC
(V)
CIN Input capacitance
Power dissipation
CPD capacitance (1)
3.3
VIN = 0 to VCC
3.3
fIN = 10MHz
VIN = 0 or VCC
Value
TA = 25 °C
Unit
Min Typ Max
6
pF
40
pF
1. CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the
operating current consumption without load. (Refer to Test Circuit). Average operating current can be
obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/2 (per gate)
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