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STM32F050C6T6A Datasheet, PDF (61/97 Pages) STMicroelectronics – Low- and medium-density advanced ARM-based 32-bit MCU with up to 32 Kbytes Flash, timers, ADC and comm. interfaces
STM32F050xx
Electrical characteristics
6.3.9
6.3.10
Memory characteristics
Flash memory
The characteristics are given at TA = –40 to 105 °C unless otherwise specified.
Table 38. Flash memory characteristics
Symbol
Parameter
Conditions
tprog
tERASE
tME
IDD
16-bit programming time
Page (1 KB) erase time
Mass erase time
Supply current
TA = –40 to +105 °C
TA = –40 to +105 °C
TA = –40 to +105 °C
Write mode
Erase mode
1. Guaranteed by design, not tested in production.
Min Typ Max(1) Unit
40 53.5 60
µs
20
-
40 ms
20
-
40 ms
-
-
10 mA
-
-
12 mA
Table 39. Flash memory endurance and data retention
Symbol
Parameter
Conditions
NEND Endurance
tRET Data retention
TA = –40 to +85 °C (6 suffix versions)
TA = –40 to +105 °C (7 suffix versions)
1 kcycle(2) at TA = 85 °C
1 kcycle(2) at TA = 105 °C
10 kcycles(2) at TA = 55 °C
1. Data based on characterization results, not tested in production.
2. Cycling performed over the whole temperature range.
Value
Min(1)
Unit
10
kcycles
30
10
Years
20
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
● Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
● FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 40. They are based on the EMS levels and classes
defined in application note AN1709.
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