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HCF4510B_02 Datasheet, PDF (6/11 Pages) STMicroelectronics – PRESETTABLE BCD UP/DOWN COUNTER
HCF4510B
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
Symbol
Parameter
VDD (V)
Test Condition
Value (*)
Unit
Min. Typ. Max.
tPHL tPLH Propagation Delay Time
5
Clock to Q Output
10
15
200 400
100 200 ns
75 150
tPHL tPLH Propagation Delay Time
5
Preset or Reset to Q
10
Output
15
tPHL tPLH Propagation Delay Time
5
Clock to Carry Out
10
210 420
105 210 ns
80 160
240 480
120 240 ns
15
tPHL tPLH Propagation Delay Time
5
Carry in to Carry Out
10
15
tPHL tPLH Propagation Delay Time
5
Preset or Reset to Carry
10
Out
15
90 180
125 250
60 120 ns
50 100
320 640
160 320 ns
125 250
tTHL tTLH Transition Time
5
10
100 200
50 100 ns
15
fMAX Maximum Clock
5
Frequency
10
40 80
2
4
4
8
MHz
15
tW Clock Pulse Width
5
10
15
tREM (1)
Preset Enable or Reset
Removal Time
5
10
15
5.5 11
150
75
ns
60
150
80
ns
60
tr , tf (2) Clock Rise or Fall Time
5
10
15
tsetup Carry in Setup Time
5
10
15
5 µs
5
130
60
ns
15
tsetup Up/Down Setup Time
5
10
15
tW Preset Enable or Reset
5
Pulse Width
10
45
360
160
ns
110
220
100
ns
15
75
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C.
(1) Time required after the falling edge of the reset or preset enable inputs before the rising edge of the clock will trigger the counter (similar
to setup time)
(2) If more than unit is cascaded in the parallel clocked application, trCL should be made less than or equal to the sum of the fixed propagation
delay at 15pF and the transition time of the carry output driving stage for the estimated capacitive load.
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