HCF4021B Datasheet, PDF (5/11 Pages) STMicroelectronics – ASYNCHRONOUS PARALLEL IN OR SYNCHRONOUS SERIAL IN/SERIAL OUT 8 - STAGE STATIC SHIFT REGISTER

HCF4021B
DYNAMIC ELECTRICAL CHARACTERISTICS (T_amb = 25°C, C_L = 50pF, R_L = 200KΩ, t_r = t_f = 20 ns)
Symbol
Parameter
V_DD (V)
Test Condition
Value (*)
Unit
Min. Typ. Max.
CLOCKED OPERATION
t_PLH t_PHL Propagation Delay Time
5
10
160 320
80 160 ns
15
t_THL t_TLH Transition Time
5
10
15
f_CL ⁽¹⁾
Maximum Clock Input
Frequency
5
10
15
60 120
100 200
50 100 ns
40 80
3
6
6 12
MHz
8.5 17
t_W Clock Pulse Width
5
10
15
t_r , t_f
Clock Input Rise or Fall
Time
5
10
15
t_setup Setup Time, serial Input
5
(ref to CL)
10
15
t_setup Setup Time, Parallel Inputs
5
(ref to P/S)
10
15
180 90
80 40
ns
50 25
15
15 µs
15
120 60
80 40
ns
60 30
50 25
30 15
ns
20 10
t_hold Hold Time, serial in,
5
parallel in, parallel /serial
10
control
15
t_WH P/S Pulse Widht
5
10
0
0
ns
0
160 80
80 40
ns
15
t_rem P/S Removal Time (ref to
5
CL)
10
15
50 25
280 140
140 70
ns
100 50
(*) Typical temperature coefficient for all V_DD value is 0.3 %/°C.
(1) If more than one unit is cascaded t_rCL should be made less than or equal to the sum of the transition time and the fixed propagation delay
of the output of the driving stage of the estimated capacitive load.
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