HCC4013B Datasheet, PDF (4/11 Pages) STMicroelectronics – DUAL ’D’ . TYPE FLIP.FLOP

HCC/HFC4013B
DYNAMIC ELECTRICAL CHARACTERISTICS (T _amb = 25°C, C_L = 50pF, R_L = 200kΩ,
typical temperature coefficient for all V_DD = 0.3%/°C values, all input rise and fall time = 20ns)
Symbol
Parameter
t_{P L H}, t_{P HL} Propagation Delay Time
(clock to Q or Q outputs)
t_PLH
Propagation Delay Time
(set to Q or reset to Q)
t_{P HL} Propagation Delay Time
(set to Q or reset to Q)
t _THL , t_{T L H} Transition Time
f_CL * Maximum Clock Input Frequency
t_W
Cock Pulse Width
t_r, t_f** Clock Input Rise or Fall Time
t_W
Set or Reset Pulse Width
t _{se tu p} Data Setup Time
Test Conditions
V al ue
V _{D D} (V) Min. Typ. Max.
5
150 300
10
65 130
15
45 90
5
150 300
10
65 130
15
45 90
5
200 400
10
85 170
15
60 120
5
100 200
10
50 100
15
40 80
5
3.5
7
10
8
16
15
12 24
5
140 70
10
60 30
15
40 20
5
15
10
4
15
1
5
180 90
10
80 40
15
50 25
5
40 20
10
20 10
15
15
7
Unit
ns
ns
ns
ns
MHz
ns
µs
ns
ns
* _{Input tr, tf = 5ns.}
** If more than unit is cascaded in a parallel clocked application, tr should be made less than or equal to the sum of the fixed
propagation delay time at 15pF and the transition time of the carry output driving stage for the estimated capacitive load.
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