74LCX240M Datasheet, PDF (4/9 Pages) STMicroelectronics – LOW VOLTAGE CMOS OCTAL BUS BUFFER (3-STATE INV) WITH 5V TOLERANT INPUTS AND OUTPUTS

74LCX240
DYNAMIC SWITCHING CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
V_CC
(V)
T_A = 25 °C
Unit
Min. Typ. Max.
V_OLP
V_OLV
Dynamic Low Level Quiet
Output (note 1)
3.3
C_L = 50pF
V_IL = 0V, V_IH = 3.3V
0.8
-0.8
V
1) Number of outputs defined as "n". Measured with "n-1" outputs switching from HIGH to LOW or LOW to HIGH. The remaining output is
measured in the LOW state.
AC ELECTRICAL CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
V_CC
C_L R_L t_s = t_r ^{-40 to 85 °C}
-55 to 125 °C Unit
(V)
(pF) (Ω) (ns) _{Min. Max. Min. Max.}
t_PLH t_PHL Propagation Delay
Time
2.7
3.0 to 3.6
50 500 2.5
1.5
1.5
7.5
6.5
1.5
1.5
8.5
7.5
ns
t_PZL t_PZH Output Enable Time
2.7
1.5
9.0
1.5
10.5
50 500 2.5
ns
3.0 to 3.6
1.5
8.0
1.5
9.2
t_PLZ t_PHZ Output Disable Time
2.7
1.5
8.0
1.5
9.2
50 500 2.5
ns
3.0 to 3.6
1.5
7.0
1.5
8.3
t_OSLH Output To Output
3.0 to 3.6 50 500 2.5
1.0
t_OSHL ^{Skew Time (note1,}
2)
1.0
ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
ing in the same direction, either HIGH or LOW (t_OSLH = | t_PLHm - t_PLHn|, t_OSHL = | t_PHLm - t_PHLn|)
2) Parameter guaranteed by design
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
V_CC
(V)
T_A = 25 °C
Unit
Min. Typ. Max.
C_IN
Input Capacitance
3.3
V_IN = 0 to V_CC
6
pF
C_OUT Output Capacitance
3.3
V_IN = 0 to V_CC
10
pF
C_PD Power Dissipation Capacitance
3.3
(note 1)
f_IN = 10MHz
V_IN = 0 or V_CC
40
pF
1) C_PD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. I_CC(opr) = C_PD x V_CC x f_IN + I_CC/8 (per circuit)
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