HCC4536B Datasheet, PDF (2/17 Pages) STMicroelectronics – PROGRAMMABLE TIMER

HCC/HCF4536B
Input IN1 serves as either the external clock input or
the input to the on-chip RC oscillator. OUT1 and
OUT2 are connection terminals for the external RC
components. In addition, an on-chip monostable cir-
cuit is provided to allow a variable pulse width out-
put. Various timing functions can be achieved using
combinations of these capabilities. A logic 1 on the
8-BYPASS input enables a bypass of the first 8 sta-
ges and makes stage 9 the first counter stage of the
last 16 stages. Selection of 1 of 16 outputs is accom-
plished by the decoder and the BCD inputs A, B, C
FUNCTIONAL DIAGRAM
and D. MONO IN is the timing input for the on-chip
monostable oscillator. Grounding of the MONO IN
terminal through a resistor of 10KΩ or higher, disa-
bles the one-shot circuit and connects the decoder
directly to the DECODE OUT terminal. A resistor to
V_DD and a capacitor to ground from the MONO IN
terminal enables the one-shot circuit and controls its
pulse width. A fast test mode is enabled by a logic
1 on 8-BYPASS, SET, and RESET. This mode di-
vides the 24-stage counter into three 8-stage sec-
tions to facilitate a fast test sequence.
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V _DD* Supply Voltage : H CC Types
H C F Types
– 0.5 to + 20
V
– 0.5 to + 18
V
V_i Input Voltage
I_I
DC Input Current (any one input)
– 0.5 to V_DD + 0.5
V
± 10
mA
P_{t o t} Total Power Dissipation (per package)
Dissipation per Output Transistor
for T_{o p} = Full Package-temperature Range
T _{o p} Operating Temperature : H CC Types
H C F Types
200
mW
100
mW
– 55 to + 125
°C
– 40 to + 85
°C
T_{s tg} Storage Temperature
– 65 to + 150
°C
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability.
* All voltages are with respect to VSS (GND).
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