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ST72321XX Datasheet, PDF (189/243 Pages) STMicroelectronics – PLL for 2x frequency multiplication
ST72321xx-Auto
Electrical characteristics
19.3.2
Operating conditions with low voltage detector (LVD)
Subject to general operating conditions for VDD, fCPU, and TA.
Table 108. Operating conditions with low voltage detector (LVD)
Symbol
Parameter
Conditions
Min
Typ
Max Unit
VIT+(LVD)
Reset release threshold
(VDD rise)
VIT-(LVD)
Reset generation threshold
(VDD fall)
VD level = High in option byte
VD level = Med. in option byte(2)
VD level = Low in option byte(2)
VD level = High in option byte
VD level = Med. in option byte(2)
VD level = Low in option byte(2)
4.0(1)
3.55(1)
2.95(1)
3.8
3.35(1)
2.8(1)
4.2
3.75
3.15
4.0
3.55
3.0
4.5
4.0(1)
3.35(1)
V
4.25(1)
3.75(1)
3.15(1)
Vhys(LVD)
LVD voltage threshold
hysteresis
VtPOR VDD rise time(2)(3)
tg(VDD)
VDD glitches filtered (not
detected) by LVD(4)
VIT+(LVD)-VIT-(LVD)
LVD enabled
6µs/V
200
mV
100ms/V -
40
ns
1. Data based on characterization results, tested in production for ROM devices only
2. Data based on characterization results, not tested in production
3. When VtPOR is faster than 100µs/V, the Reset signal is released after a delay of maximum 42µs after VDD crosses the
VIT+(LVD) threshold.
4. If the medium or low thresholds are selected, the detection may occur outside the specified operating voltage range. Below
3.8V, device operation is not guaranteed.
19.3.3
Auxiliary voltage detector (AVD) thresholds
Subject to general operating conditions for VDD, fCPU, and TA.
Table 109. Auxiliary voltage detector (AVD) thresholds
Symbol
Parameter
Conditions
VIT+(AVD)
10 AVDF flag toggle threshold
(VDD rise)
VD level = High in option byte
VD level = Med. in option byte
VD level = Low in option byte
VIT-(AVD)
01 AVDF flag toggle threshold
(VDD fall)
VD level = High in option byte
VD level = Med. in option byte
VD level = Low in option byte
Vhys(AVD) AVD voltage threshold hysteresis VIT+(AVD)-VIT-(AVD)
VIT-
Voltage drop between AVD flag set
and LVD reset activated
VIT-(AVD)-VIT-(LVD)
1. Data based on characterization results, tested in production for ROM devices only
Min
4.4(1)
3.95(1)
3.4(1)
4.2(1)
3.75(1)
3.2(1)
Typ
4.6
4.15
3.6
4.4
4.0
3.4
200
450
Max Unit
4.9(1)
4.4(1)
3.8(1)
V
4.65(1)
4.2(1)
3.6(1)
mV
Doc ID 13829 Rev 1
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