S29AL016M Datasheet, PDF (41/59 Pages) SPANSION – 16 MEGABIT (2M X 8 BIT / I M X 16 BIT) 3.0 VOLT ONLY BOOT SECTOR FLASH MEMORY

Test Conditions
Device
Under
Test
3.3 V
2.7 kΩ
C_L
6.2 kΩ
Note: Diodes are IN3064 or equivalent
Figure 11. Test Setup
Table 13. Test Specifications
Test Condition
90, 100 Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
Input timing measurement
reference levels
0.0 or V_CC
V
0.5 V_CC
V
Output timing measurement
reference levels
0.5 V_CC
V
Key to Switching Waveforms
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
V_CC
0.0 V
Input
0.5 V_CC
Measurement Level
0.5 V_CC Output
Figure 12. Input Waveforms and Measurement Levels
April 21, 2004 S29AL016M_00A4
S29AL016M
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