SSF8810 Datasheet, PDF (3/7 Pages) Silikron Semiconductor Co.,LTD. – Advanced MOSFET process technology

Test circuits and Waveforms
EAS Test Circuit:
Gate charge test circuit:
SSF8810
Switching Time Test Circuit:
Switching Waveforms:
Notes:
①Calculated continuous current based on maximum allowable junction temperature.
②Repetitive rating; pulse width limited by max. junction temperature.
③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal
resistance.
④The value of R_θJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a
still air environment with TA =25°C
©Silikron Semiconductor CO., LTD.
2013.09.20
www.silikron.com
Version: 1.0
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