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SI4455-B1A-FM Datasheet, PDF (9/40 Pages) Silicon Laboratories – EASY-TO-USE, LOW-CURRENT OOK/(G)FSK SUB-GHZ TRANSCEIVER
Si4455
Table 7. Digital IO Specifications (GPIO_x, SCLK, SDO, SDI, nSEL, nIRQ)1
Parameter
Symbol
Test Condition
Min
Typ Max
Rise Time
Fall Time
Input Capacitance
Logic High Level Input Voltage
Logic Low Level Input Voltage
Input Current
Input Current if Pullup is Activated
Drive Strength for Output Low
Level2
Drive Strength for Output High
Level (GPIO1, GPIO2, GPIO3)2
Drive Strength for Output High
Level (GPIO0)2
Logic High Level Output Voltage
Logic Low Level Output Voltage
TRISE
TFALL
CIN
VIH
VIL
IIN
IINP
IOmaxLL
IOmaxLH
IOmaxHL
IOmaxHH
IOmaxLL
IOmaxLH
IOmaxHL
IOmaxHH
IOmaxLL
IOmaxLH
IOmaxHL
IOmaxHH
VOH
VOL
0.1 x VDD to 0.9 x VDD,
CL= 10 pF, DRV<1:0> = LL
VDD = 3.3 V
0.9 x VDD to 0.1 x VDD,
CL= 10 pF, DRV<1:0> = LL
VDD = 3.3 V
0 < VIN < VDD
VIL = 0 V
DRV[1:0] = LL
DRV[1:0] = LH
DRV[1:0] = HL
DRV[1:0] = HH
DRV[1:0] = LL
DRV[1:0] = LH
DRV[1:0] = HL
DRV[1:0] = HH
DRV[1:0] = LL
DRV[1:0] = LH
DRV[1:0] = HL
DRV[1:0] = HH
DRV[1:0] = HL
DRV[1:0] = HL
—
—
—
VDD x 0.7
—
–10
1
—
—
—
—
—
—
—
—
—
—
—
—
VDD x 0.8
—
2.3
2
2
—
—
—
—
6.66
5.03
3.16
1.13
5.75
4.37
2.73
0.96
2.53
2.21
1.7
0.80
—
—
—
—
—
—
VDD x 0.3
10
10
—
—
—
—
—
—
—
—
—
—
—
—
—
VDD x 0.2
Notes:
1. All specifications guaranteed by qualification. Qualification test conditions are listed under “Qualification Test
Conditions” in "1.1. Definition of Test Conditions" on page 11.
2. GPIO output current measured at 3.3 VDC VDD with VOH = 2.64 VDC and VOL = 0.66 VDC.
Unit
ns
ns
pF
V
V
µA
µA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
V
V
Rev 1.1
9