EFM32GG232 Datasheet, PDF (9/71 Pages) Silicon Laboratories – High Performance 32-bit processor

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3 Electrical Characteristics
3.1 Test Conditions
3.1.1 Typical Values
The typical data are based on T_AMB=25°C and V_DD=3.0 V, as defined in Table 3.2 (p. 9) , unless
otherwise specified.
3.1.2 Minimum and Maximum Values
The minimum and maximum values represent the worst conditions of ambient temperature, supply volt-
age and frequencies, as defined in Table 3.2 (p. 9) , unless otherwise specified.
3.2 Absolute Maximum Ratings
The absolute maximum ratings are stress ratings, and functional operation under such conditions are
not guaranteed. Stress beyond the limits specified in Table 3.1 (p. 9) may affect the device reliability
or cause permanent damage to the device. Functional operating conditions are given in Table 3.2 (p.
9) .
Table 3.1. Absolute Maximum Ratings
Symbol
T_STG
T_S
V_DDMAX
V_IOPIN
I_IOMAX
Parameter
Condition
Min
Typ
Storage tempera-
-40
ture range
Maximum soldering Latest IPC/JEDEC J-STD-020
temperature
Standard
External main sup-
0
ply voltage
Voltage on any I/O
-0.3
pin
Current per I/O pin
(sink)
Current per I/O pin
(source)
3.3 General Operating Conditions
3.3.1 General Operating Conditions
Table 3.2. General Operating Conditions
Max
Unit
150 °C
260 °C
3.8 V
V_DD+0.3 V
100 mA
-100 mA
Symbol
T_AMB
V_DDOP
f_APB
f_AHB
Parameter
Ambient temperature range
Operating supply voltage
Internal APB clock frequency
Internal AHB clock frequency
Min
Typ
-40
1.98
Max
Unit
85 °C
3.8 V
48 MHz
48 MHz
2016-03-21 - EFM32GG232FXX - d0125_Rev1.40
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