SI534 Datasheet, PDF (4/10 Pages) Silicon Laboratories – CRYSTAL OSCILLATOR (XO) (10 MHZ TO 1.4 GHZ)

Si534
Table 6. CLK± Output Phase Noise (Typical)
Configuration
f_C
Output
81.25 MHz
LVDS
312.5 MHz
LVPECL
Offest Frequency (f)
100 Hz
1 kHz
10 kHz
100 kHz
1 MHz
10 MHz
100 MHz
–110
–127
–134
–136
–143
–147
n/a
L (f)
–100
–115
–119
–123
–135
–144
–147
1066 MHz
LVPECL
Units
–87
–102
–107
–111
–121
–135
–142
dBc/Hz
Table 7. Absolute Maximum Ratings¹
Parameter
Symbol
Rating
Units
Supply Voltage
V_DD
–0.5 to +3.8
Volts
Input Voltage (any input pin)
V_I
–0.5 to V_DD + 0.3
Volts
Storage Temperature
T_S
–55 to +125
ºC
ESD Sensitivity (HBM, per JESD22-A114)
ESD
>2500
Volts
Soldering Temperature (Pb-free profile)²
Soldering Temperature Time @ T_PEAK (Pb-free profile)²
T_PEAK
t_P
260
ºC
10
seconds
Notes:
1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional
operation or specification compliance is not implied at these conditions.
2. Refer to Si5xx Packaging FAQ available for download at www.silabs.com/VCXO for further information, including
soldering profiles.
Table 8. Environmental Compliance
The Si534 meets the following qualification test requirements.
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross & Fine Leak
Resistance to Solvents
Conditions/ Test Method
MIL-STD-883F, Method 2002.3 B
MIL-STD-883F, Method 2007.3 A
MIL-STD-883F, Method 203.8
MIL-STD-883F, Method 1014.7
MIL-STD-883F, Method 2016
4
Preliminary Rev. 0.4