SLWSTK6020A Datasheet, PDF (36/102 Pages) Silicon Laboratories – EFR32BG1 Blue Gecko Bluetooth® Smart SoC Family Data Sheet

EFR32BG1 Blue Gecko Bluetooth® Smart SoCFamily Data Sheet
Electrical Specifications
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Step size
SS_HFRCO
Coarse (% of period)
Fine (% of period)
—
0.8
—
%
—
0.1
—
%
Period Jitter
PJ_HFRCO
—
0.2
—
% RMS
Note:
1. Current consumption on DVDD instead if ANASW=1 in EMU_PWRCTRL register
4.1.11.5 ULFRCO
Table 4.23. ULFRCO
Parameter
Oscillation frequency
Symbol
f_ULFRCO
Test Condition
Min
Typ
Max
Unit
TBD
1
TBD
kHz
4.1.12 Flash Memory Characteristics
Table 4.24. Flash Memory Characteristics¹
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Flash erase cycles before
failure
EC_FLASH
10000
—
—
cycles
Flash data retention
RET_FLASH
T_AMB<85°C
10
—
—
years
Word (32-bit) programming t_{W_PROG}
time
20
26
40
μs
Page erase time
t_PERASE
20
27
40
ms
Mass erase time
t_MERASE
20
27
40
ms
Device erase time²
t_DERASE
—
60
TBD
ms
Page erase current³
I_ERASE
—
—
3
mA
Mass or Device erase cur-
rent³
—
—
5
mA
Write current³
I_WRITE
—
—
3
mA
Note:
1. Flash data retention information is published in the Quarterly Quality and Reliability Report.
2. Device erase is issued over the AAP interface and erases all flash, SRAM, the Lock Bit (LB) page, and the User data page Lock
Word (ULW)
3. Measured at 25°C
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