EFM32WG995 Datasheet, PDF (36/85 Pages) Silicon Laboratories – Operation from backup battery when main power drains out

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Symbol
Parameter
Condition
Min
Typ
Max
Unit
200 kSamples/s, 12 bit, differ-
ential, internal 1.25V reference
79
dBc
200 kSamples/s, 12 bit, differ-
ential, internal 2.5V reference
79
dBc
200 kSamples/s, 12 bit, differ-
ential, 5V reference
78
dBc
200 kSamples/s, 12 bit, differ-
68
79
ential, V_DD reference
200 kSamples/s, 12 bit, differ-
79
ential, 2xV_DD reference
After calibration, single ended
-3.5
0.3
V_ADCOFFSET Offset voltage
After calibration, differential
0.3
dBc
dBc
3 mV
mV
TGRAD_ADCTH
Thermometer out-
put gradient
-1.92
-6.3
mV/°C
ADC
Codes/
°C
DNL_ADC
Differential non-lin-
earity (DNL)
-1
±0.7
4 LSB
INL_ADC
Integral non-linear-
ity (INL), End point
method
±1.2
±3 LSB
MC_ADC
GAIN_ED
No missing codes
Gain error drift
1.25V reference
2.5V reference
11.999¹
12
0.01²
0.01²
bits
0.033³ %/°C
0.03³ %/°C
OFFSET_ED Offset error drift
1.25V reference
2.5V reference
0.2²
0.7³ LSB/°C
0.2²
0.62³ LSB/°C
1_{On the average every ADC will have one missing code, most likely to appear around 2048 +/- n*512 where n can be a value in}
the set {-3, -2, -1, 1, 2, 3}. There will be no missing code around 2048, and in spite of the missing code the ADC will be monotonic
at all times so that a response to a slowly increasing input will always be a slowly increasing output. Around the one code that is
missing, the neighbour codes will look wider in the DNL plot. The spectra will show spurs on the level of -78dBc for a full scale
input for chips that have the missing code issue.
2_{Typical numbers given by abs(Mean) / (85 - 25).}
3_{Max number given by (abs(Mean) + 3x stddev) / (85 - 25).}
The integral non-linearity (INL) and differential non-linearity parameters are explained in Figure 3.24 (p.
37) and Figure 3.25 (p. 37) , respectively.
2014-06-13 - EFM32WG995FXX - d0204_Rev1.40
36
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