SI5310-EVB Datasheet, PDF (3/12 Pages) Silicon Laboratories – Simple jumper configuration

Si5310-EVB
Table 1. CLKIN, CLKOUT, MULTOUT, REFCLK Operating Ranges
MULTSEL
CLKIN Range
(MHz)
REFCLK = 2ⁿ x CLKIN
±100 ppm
(see Note 2)
CLKOUT
MULTOUT
37.500–41.750
n = –2, –1, 0, 1, or 2
1xCLKIN
16xCLKIN
0
(MULTOUT = 600–668 MHz)
75.000–83.500
150.000–167.000
300.000–334.000
n = –3, –2, –1, 0, or 1
n = –4, –3, –2, –1, or 0
n = –5, –4, –3, –2, or –1
1xCLKIN
1xCLKIN
1xCLKIN
8xCLKIN
4xCLKIN
2xCLKIN
600.000–668.000 n = –6, –5, –4, –3, or –2 See Note 1
1xCLKIN
9.375–10.438
n = 0, 1, 2, 3, or 4
1xCLKIN
16xCLKIN
1
(MULTOUT = 150–167 MHz)
18.750–20.875
37.500–41.750
75.000–83.500
n = –1, 0, 1, 2, or 3
n = –2, –1, 0, 1, or 2
n = –3, –2, –1, 0, or 1
1xCLKIN
1xCLKIN
1xCLKIN
8xCLKIN
4xCLKIN
2xCLKIN
150.000–167.000 n = –4, –3, –2, –1, or 0 See Note 1
1xCLKIN
Note:
1. The CLKOUT output is not valid for MULTOUT:CLKIN ratios of 1:1 (MULTOUT = 1 x CLKIN.)
2. The REFCLK input can be set to any one of the five CLKIN multiples indicated. The REFCLK input can be
asynchronous to the CLKIN input, but must be within ±100 ppm of the stated CLKIN multiple.
upper right-hand side of the evaluation board.
Test Configuration
MU LTSEL
PWRDN/
C AL
M ULTS EL
High Range
600–668 MHz
MU LTSEL
PWRDN/
C AL
M ULTS EL
Low Range
150–167 MHz
Figure 1. MULTSEL Jumper Configurations
Loss-of-Lock (LOL)
LOL is an indicator of the relative frequency between
the REFCLK input, which is nominally a multiple of
CLKIN, and an internally generated multiple of CLKIN.
LOL will assert when the frequency difference is greater
than ±600 PPM. In order to prevent LOL from de-
asserting prematurely, there is hysterisis in returning
from the out of lock condition. LOL will be de-asserted
(indicating a lock condition) when the frequency
difference is less than ±300 PPM.
LOL is wired to a test point which is located on the
The characterization of clock sources typically involves
measuring the output jitter or phase noise of the source.
The overall output jitter is a function of the input jitter
(jitter transfer) and the jitter generated (output jitter) by
the internal PLL.
Jitter can be measured using several different
techniques and hardware. An oscilloscope, a spectrum
analyzer, and a phase-noise analyzer are three such
instruments capable of measuring output jitter. A
spectrum analyzer is the best choice for measuring jitter
transfer.
Output Jitter
Output jitter is a measure of the output clock short-term
stability. In Figure 2, either position A or B can be used
when measuring this parameter.
Oscilloscope
An oscilloscope can measure jitter from the clock edges
within the trigger-to-capture bandwidth. Typically the
jitter measured is expressed in picoseconds (peak-to-
peak and RMS) relative to the average edge position. A
histogram can be used to capture the jitter distribution.
Rev. 0.71
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