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SI8640BA-B-IU Datasheet, PDF (22/42 Pages) Silicon Laboratories – Low-Power Quad-Channel Digital Isolators
Si864x Data Sheet
Electrical Specifications
Table 4.6. Insulation and Safety-Related Specifications
Parameter
Symbol
Test
Value
Unit
Condition WB SOIC-16 NB SOIC-16 QSOP-16
Nominal Air Gap (Clearance) 1
L(IO1)
8.0
4.9
3.6
mm
Nominal External Tracking (Creepage) 1
L(IO2)
8.0
4.01
3.6
mm
Minimum Internal Gap
0.014
0.014
0.014
mm
(Internal Clearance)
Tracking Resistance
(Proof Tracking Index)
PTI
IEC60112
600
600
600
VRMS
Erosion Depth
ED
0.019
0.019
0.031
mm
Resistance (Input-Output) 2
RIO
1012
1012
1012
Ω
Capacitance (Input-Output) 2
CIO
f = 1 MHz
2.0
2.0
2.0
pF
Input Capacitance 3
CI
4.0
4.0
4.0
pF
Note:
1. The values in this table correspond to the nominal creepage and clearance values. VDE certifies the clearance and creepage
limits as 4.7 mm minimum for the NB SOIC-16 package and QSOP-16 packages and 8.5 mm minimum for the WB SOIC-16
package. UL does not impose a clearance and creepage minimum for component-level certifications. CSA certifies the clearance
and creepage limits as 3.9 mm minimum for the NB SOIC-16, 3.6 mm for QSOP-16 packages, and 7.6 mm minimum for the WB
SOIC-16 package.
2. To determine resistance and capacitance, the Si86xx is converted into a 2-terminal device. Pins 1–8 are shorted together to form
the first termina and pins 9–16 are shorted together to form the second terminal. The parameters are then measured between
these two terminals.
3. Measured from input pin to ground.
Parameter
Basic Isolation Group
Installation Classification
Table 4.7. IEC 60664-1 Ratings
Test Conditions
Material Group
Rated Mains Voltages < 150
VRMS
Rated Mains Voltages < 300
VRMS
Rated Mains Voltages < 400
VRMS
Rated Mains Voltages < 600
VRMS
WB SOIC-16
I
I-IV
I-IV
I-III
I-III
Specification
NB SOIC-16
I
I-IV
I-III
I-II
I-II
QSOP-16
I
I-IV
I-III
I-II
I-II
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