SI53314 Datasheet, PDF(10/32 Page) Silicon Laboratories – 1:6 LOW JITTER UNIVERSAL BUFFER/LEVEL

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SI53314 Datasheet, PDF (10/32 Pages) Silicon Laboratories – 1:6 LOW JITTER UNIVERSAL BUFFER/LEVEL

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Si53314

Table 13. Thermal Conditions

Parameter

Thermal Resistance,

Junction to Ambient

Thermal Resistance,

Junction to Case

Symbol

ï±JA

ï±JC

Test Condition

Still air

Value

49.6

32.3

Unit

Â°C/W

Table 14. Absolute Maximum Ratings

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Storage Temperature

Supply Voltage

Input Voltage

Output Voltage

ESD Sensitivity

VDD

VIN

VOUT

HBM

HBM, 100 pF, 1.5 kï

â55

150

ï°C

â0.5

3.8

â0.5

VDD+ 0.3

2000

ESD Sensitivity

CDM

500

Peak Soldering

TPEAK Pb-Free; Solder reflow profile

260

ï°C

Reflow Temperature

per JEDEC J-STD-020

Maximum Junction

Temperature

125

ï°C

Note: Stresses beyond those listed in this table may cause permanent damage to the device. Functional operation

specification compliance is not implied at these conditions. Exposure to maximum rating conditions for extended

periods may affect device reliability.

Rev. 1.0

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