S-8426AAA-J8T1X Datasheet, PDF (8/37 Pages) Seiko Instruments Inc – BATTERY BACKUP SWITCHING IC

BATTERY BACKUP SWITCHING IC
S-8426A Series
 Test Circuits
Rev.2.0_02
VIN VRO or
VOUT
V_IN
VSS
↓
V
10 μF
Figure 5 Test Circuit 1
VBAT VOUT _CS
A
VIN
V_IN
PREEND A
VSS
RESET _A
V_DS
Figure 7 Test Circuit 3
F.G.
VIN
VOUT
VSS _VBAT CS
V_BAT
Oscillo
scope
100 kΩ
Oscillo
scope
Figure 9 Test Circuit 5
VIN
VOUT
VBAT
I_OUT
V_IN
V_BAT
VSS
↓_V
Leave open and measure the value after
applying 6 V to VIN.
Figure 11 Test Circuit 7
VBAT ^V
V ^VIN
VBAT VOUT
VIN _PREEND
VSS
RESET
CS
100 kΩ 100 kΩ 100 kΩ
V
V
V
To measure VDET3, apply 6 V to VIN.
Figure 6 Test Circuit 2
VIN
VOUT
V_IN
V
V_BAT ^VBAT
V
VSS
Measure the value after applying 6 V to VIN.
Figure 8 Test Circuit 4
VIN
VBAT
V_IN
A
VSS
Figure 10 Test Circuit 6
I_SS A
V_IN
A I_BAT
V_BAT
VIN
VBAT
VSS
To measure I_BAT2, apply 6 V to VIN and then
leave VIN open and measure I_BAT.
Figure 12 Test Circuit 8
8