S-809XXC Datasheet, PDF (16/36 Pages) Seiko Instruments Inc – ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING)

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING)
S-809xxC Series
Rev.3.3_00
V_DD
(−V_DET) Max.
(−V_DET) Min.
Detection voltage
Detection voltage
range
Release voltage
(+V_DET) Max.
(+V_DET) Min.
V_DD
Release
voltage range
OUT
OUT
Delay time
Figure 19 Detection Voltage (CMOS output products)
Figure 20 Release Voltage (CMOS output products)
Remark Although the detection voltage and release voltage overlap in the range of 2.725 V to 2.754 V,
+V_DET is always larger than −V_DET.
2. Hysteresis Width (V_HYS)
Hysteresis width is the voltage difference between the detection voltage and the release voltage (The
voltage at point B−The voltage at point A=V_HYS in Figure 15). The existence of the hysteresis width avoids
malfunction caused by noise on input signal.
3. Delay Time (t_D)
Delay time is a time internally measured from the instant at which input voltage to the VDD pin exceeds
the release voltage (+V_DET) to the point at which the output of the OUT pin inverts. The delay time
changes according to the external capacitor (C_D).
V
V_DD
+V_DET
OUT
t_D
Figure 21
4. Through-type Current
The through-type current refers to the current that flows instantaneously at the time of detection and
release of a voltage detector. The through-type current is large in CMOS output products, and small in Nch
open-drain output products.
16
Seiko Instruments Inc.