S-8233B_1 Datasheet, PDF (12/26 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 3-SERIAL-CELL PACK

BATTERY PROTECTION IC FOR 3-SERIAL-CELL PACK
S-8233B Series
Rev.4.2_00
V6
I6
DOP
VCC
COP
V1
CD1
V5
VMP
V4
CTL
VC1
V2
CD2
VC2
V3
CD3
VSS
S-8233B
CCT
CDT
COVT
Test circuit 5
V5
1MΩ
DOP
VCC
COP
VMP
V1
CD1
CTL ^V4
VC1
V2
CD2
VC2
V3
CD3
VSS
S-8233B
CCT
C1 = 0.47 μF
C2 = 0.1 μF
C3 = 0.1 μF
CDT
COVT
C1
S1
C2
C3
Test circuit 7
1MΩ
DOP
VCC
V1
CD1
COP
VMP
CTL ^V4
VC1
V2
CD2
S-8233B
CCT
C1
C1 = 0.47 μF
VC2
C2 = 0.1 μF
CDT
C2
V3
CD3
C3 = 0.1 μF
COVT
C3
VSS
Test circuit 6
1MΩ
I8 _V8
S1
V1
DOP
VCC
CD1
S4 _I5
V5 _VC1
COP
S2
V2
CD2
S5 I6
V6 _VC2
S3
V3
CD3
S6 I7
V7 _VSS
S-8233B
VMP
CTL ^V4
CCT
CDT
COVT
Test circuit 8
I1
DOP
VCC
V1
CD1
COP
VMP
CTL ^V4
VC1
V2
CD2
VC2
V3
CD3
VSS
S-8233B
CCT
CDT
COVT
Test circuit 9
Figure 4 (2/2)
V5
1MΩ
DOP
VCC
V1
CD1
COP
VMP
V4
CTL
VC1
V2
CD2
VC2
V3
CD3
VSS
S-8233B
CCT
CDT
COVT
Test circuit 10
12
Seiko Instruments Inc.