S-8244 Datasheet, PDF (10/27 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 1-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION)

BATTERY PROTECTION IC FOR 1-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION)
S-8244 Series
Rev.3.3_00
(7) Test Condition 7, Test Circuit 4
Conditions:
• Set switch 1 to OFF and switch 2 to ON.
Definitions:
• Set V1, V2, V3 and V4 to 4.6 V and gradually decrease V6 from V_CC (for CMOS output active “H”
models).
V6 voltage is defined as V_{CO (H)} when I2 (= -10 µA) flows.
• Set V1, V2, V3 and V4 to 3.5 V and gradually decrease V6 from V_CC (for CMOS output active “L” or
Pch open drain models).
V6 voltage is defined as V_{CO (H)} when I2 (= -10 µA) flows.
• Set V1, V2, V3 and V4 to 4.6 V and gradually increase V6 from 0 V (for CMOS output active “L”
models).
V6 voltage is defined as V_{CO (L)} when I2 (= 10 µA) flows.
• Set V1, V2, V3 and V4 to 3.5 V and gradually increase V6 from 0 V (for CMOS output active “H” or
Nch open drain models).
V6 voltage is defined as V_{CO (L)} when I2 (= 10 µA) flows.
10 MΩ
S-8244
VCC
CO
SW1
10 MΩ
S-8244
VCC
CO
SW1
SENSE ICT
SW2
SENSE ICT
SW2
V1
VC1
VSS
V ^V1
0.1 µF
VC1
VSS
V
V2
V4
V2
V4
VC2
VC3
V3
10 MΩ
V3
VC2
VC3
10 MΩ
Test Circuit 1
S-8244
VCC
CO
SENSE ICT
I1 V1 _I2
V1
VC1
VSS
V2
I3
V4
I4
V2
VC2
VC3
V3
V3
Test Circuit 2
I1
V5
S-8244
VCC
CO
SENSE ICT
VC1
VSS
VC2
VC3
SW1
SW2
V
V4
I2
V6
Test Circuit 3
Test Circuit 4
Figure 5
10
Seiko Instruments Inc.