S-8211D Datasheet, PDF (10/36 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 1-CELL PACK

BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211D Series
Rev.4.5_00
3. Detection Delay Time
(1) S-8211DAB, S-8211DAE, S-8211DAG, S-8211DAH, S-8211DAI, S-8211DAJ, S-8211DAK, S-8211DAL,
S-8211DAM
Table 10
Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condi-
Test
Circuit
tion
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C) ^*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
tCU
tDL
tDIOV
tSHORT
tCU
tDL
tDIOV
tSHORT
−
0.96 1.2 1.4 s 8
5
−
120 150 180 ms 8
5
−
7.2
9
11 ms 9
5
−
240 300 360 µs 9
5
−
0.7 1.2 2.0 s 8
5
−
83 150 255 ms 8
5
−
5
9
15 ms 9
5
−
150 300 540 µs 9
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
(2) S-8211DAF
Table 11
Test _Test
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Condi-
tion
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C) ^*1
t_CU
tDL
tDIOV
tSHORT
−
0.96 1.2 1.4 ^{s 8}
5
−
61 75 90 ^{ms 8}
5
−
7.2
9
11 ^{ms 9}
5
−
240 300 360 ^{µs 9}
5
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
t_CU
tDL
tDIOV
tSHORT
−
0.7 1.2 2.0 ^{s 8}
5
−
41 75 128 ^{ms 8}
5
−
5
9
15 ^{ms 9}
5
−
150 300 540 ^{µs 9}
5
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
10
Seiko Instruments Inc.