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HYM322005S Datasheet, PDF (5/10 Pages) Siemens Semiconductor Group – 2M x 32-Bit Dynamic RAM Module
HYM 322005S/GS-50/-60
2M × 32-Bit EDO-Module
Absolute Maximum Ratings
Operating temperature range ......................................................................................... 0 to + 70 °C
Storage temperature range...................................................................................... – 55 to + 125 °C
Input/output voltage ........................................................................................................ – 1 to + 7 V
Power supply voltage...................................................................................................... – 1 to + 7 V
Power dissipation................................................................................................................... 2.52 W
Data out current (short circuit) ................................................................................................ 50 mA
Note: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent
damage to the device. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability.
DC Characteristics
TA = 0 to 70 °C, VSS = 0 V, VCC = 5 V ± 10 %; tT = 2 ns
Parameter
Symbol
Limit Values
min.
max.
Input high voltage
VIH
Input low voltage
VIL
Output high voltage (IOUT = – 5 mA)
VOH
Output low voltage (IOUT = 4.2 mA)
VOL
Input leakage current
II(L)
(0 V ≤ VIH ≤ Vcc + 0.3V, all other pins = 0 V)
Output leakage current
IO(L)
(DO is disabled, 0 V ≤ VOUT ≤ Vcc + 0.3V)
Average VCC supply current:
ICC1
-50 ns version
-60 ns version
(RAS, CAS, address cycling: tRC = tRC min.)
Standby VCC supply current
ICC2
(RAS = CAS = VIH)
Average VCC supply current, during RAS-only ICC3
refresh cycles:
-50 ns version
-60 ns version
(RAS cycling, CAS = VI,H, tRC = tRC min.)
Average VCC supply current,during hyper page ICC4
mode (EDO):
-50 ns version
-60 ns version
(RAS = VIL, CAS, address cycling:
(tHPC = tHPC min.)
2.4
– 0.5
2.4
–
– 10
– 10
Vcc+0.5
0.8
–
0.4
10
10
–
400
–
360
–
8
–
400
–
360
–
180
–
150
Unit Test
Condition
V
1)
V
1)
V
1)
V
1)
µA 1)
µA 1)
mA 2) 3) 4)
mA 2) 3) 4)
mA –
mA 2) 4)
mA 2) 4)
mA 2) 3) 4)
mA 2) 3) 4)
Semiconductor Group
5