English
Language : 

SUD10P06-280L Datasheet, PDF (2/7 Pages) Vishay Siliconix – P-Channel 60-V (D-S), 175C MOSFET, Logic Level
◁
SUD10P06-280L
P-Channel 60 V (D-S) 175 °C MOSFET
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Static
Drain-Source Breakdown Voltage
Gate-Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Currentb
Drain-Source On-State Resistanceb
Forward Transconductanceb
Dynamic
VDS
VGS(th)
IGSS
IDSS
ID(on)
RDS(on)
gfs
VDS = 0 V, ID = - 250 µA
VDS = VGS, ID = - 250 µA
VDS = 0 V, VGS = ± 20 V
VDS = - 60 V, VGS = 0 V
VDS = - 60 V, VGS = 0 V, TJ = 125 °C
VDS = - 60 V, VGS = 0 V, TJ = 175 °C
VDS = - 5 V, VGS = - 10 V
VGS = - 10 V, ID = - 5 A
VGS = - 10 V, ID = - 5 A, TJ = 125 °C
VGS = - 10 V, ID = - 5 A, TJ = 175 °C
VGS = - 4.5 V, ID = - 2 A
VDS = - 15 V, ID = - 5 A
Input Capacitance
Ciss
Output Capacitance
Coss
VDS = - 25 V, VGS = 0 V, f = 1 MHz
Reverse Transfer Capacitance
Crss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
VDS = - 30 V, VGS = - 10 V, ID = - 10 A
Gate-Drain Charge
Qgd
Turn-On Delay Timec
td(on)
Rise Timec
Turn-Off Delay Timec
tr
td(off)
VDD = - 30 V, RL = 3 Ω
ID ≅ 10 A, VGEN = - 10 V, RG = 2.5 Ω
Fall Timec
tf
Source-Drain Diode Ratings and Characteristics TC = 25 °Ca
Pulsed Current
ISM
Forward Voltageb
VSD
IF = 10 A, VGS = 0 V
Reverse Recovery Time
trr
IF = 10 A, dI/dt = 100 A/µs
Notes:
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
c. Independent of operating temperature.
Min.
- 60
- 1.0
- 10
Typ.a
Max.
- 2.0
- 3.0
± 100
-1
- 50
- 150
0.130
0.210
6
0.170
0.31
0.375
0.280
635
100
30
11.5
25
3.5
2
9
20
16
20
17
30
19
35
- 20
- 1.3
50
80
Unit
V
nA
µA
A
Ω
S
pF
nC
ns
A
V
ns
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
2/7
www.freescale.net.cn
 ▷