|
LH28F400SUB Datasheet, PDF (1/34 Pages) Sharp Electrionic Components – 4M (512K × 8, 256K × 16) Flash Memory | |||
|
LH28F400SUB-Z0
4M (512K Ã 8, 256K Ã 16)
Flash Memory
FEATURES
⢠User-Configurable x8 or x16 Operation
⢠5 V Write/Erase Operation
(5 V VPP, 3.3 V VCC)
â No Requirement for DC/DC Converter to
Write/Erase
⢠150 ns Maximum Access Time
(VCC = 3.3 V ± 0.3 V)
⢠Min. 2.7 V Read Capability
â 160 ns Maximum Access Time
(VCC = 2.7 V)
⢠32 Independently Lockable Blocks (16K)
⢠100,000 Erase Cycles per Block
⢠Automated Byte Write/Block Erase
â Command User Interface
â Status Register
â RY /» BY» Status Output
⢠System Performance Enhancement
â Erase Suspend for Read
â Two-Byte Write
â Full Chip Erase
⢠Data Protection
â Hardware Erase/Write Lockout during
Power Transition
â Software Erase/Write Lockout
⢠Independently Lockable for Write/Erase
on Each Block (Lock Block and Protect
Set/Reset)
⢠4 µA (Typ.) ICC in CMOS Standby
⢠0.2 µA (Typ.) Deep Power-Down
⢠State-of-the-Art 0.45 µm ETOX⢠Flash
Technology
⢠Extended Temperature Operation
â -20°C to +85°C
⢠49-Pin, .67 mm à 8 mm à 8 mm
CSP Package
49-PIN CSP
TOP VIEW
1
2
3
4
5
6
7
A A1
A4
A7 VPP A9
A12 A15
B A2 A5 A17 RP A8 A11 A14
C A3 A6 RY/BY NC WE A10 A13
D A0 DQ9 NC NC NC DQ13 A16
E OE DQ1 DQ3 DQ11 DQ4 DQ6 DAQ-115/
F GND DQ8 DQ10 VCC DQ12 DQ14 GND
G CE DQ0 DQ2 VCC DQ5 DQ7 BYTE
28F400SUB-1
Figure 1. CSP Configuration
1
|
▷ |