SGM4717YD Datasheet, PDF (7/10 Pages) SG Micro Corp – 4.5Ω, 300MHz Bandwidth, Dual, SPDT Analog Switch

TEST CIRCUITS (Cont.)
RS
IN+
NO1 or NC1
IN1
RS
IN-
NO2 or NC2
IN2
COM1
COM2
OUT+
CL
Rise Time Delay = |tINRISE–tOUTRISE|
Fall Time Delay = |tINFALL–tOUTFALL|
Rise Time to Fall Time Mismatch = |tOUTFALL–tOUTRISE|
OUT-
C_L
V₊
VIN+
0V
V₊
VIN-
0V
V₊
VOUT+
0V
V₊
V_OUT-
ON
0V
tINFALL
50% ^90%
10%
50%
tINFALL
50%
90%
10%
50%
tINRISE
90%
10%
tINRISE
90%
10%
t_SKEW
Test Circuit 4. Output Signal Skew
V₊
0.1µF
Source
Signal
V₊
NO or NC
COM
IN
GND
Test Circuit 5. Off Isolation
V_OUT
C_L
5pF
7
SGM4717YD