YGFR411-H_12 Datasheet, PDF (7/13 Pages) Seoul Semiconductor – Surface-mounted chip LED device

5. Reliability Test
Item
Operating at
Room
temperature
Test Conditions
℃ 20mA, @25
Duration ^{Number Of}
/ Cycle _Damaged
500 hrs
0/22
Operating at High
temperature
℃ 20mA, @85
500 hrs
0/22
Operating at High
temperature
/ High humidity
℃ 20mA, @60 ,90%
500 hrs
0/22
Thermal shock
test
Thermal
resistance
Test
℃ -40~85 Shift (2hr/cycle)
100 cycle
0/22
℃ 85 , 85% 24hrs Reflow 3 times
℃ (Max 260 10sec) Thermal shock
30 cycle
1 time
0/22
℃ MSL : 2a (30 , 60% : 4 weeks)
*Criterion
Iv
V_F
OK
> Initial value * 0.5
Initial value ± 0.1V
Rev. 03
January 2012
WWW.SEOULSEMICON.COM
서식번호 : SSC- QP- 7- 07- 25 (Rev.0.0)