ERT801-S Datasheet, PDF (7/13 Pages) Seoul Semiconductor – Industry Standard PLCC SMT package Available in multiple colors

5 Reliability
Item
Reference
Test Condition
Thermal Shock
Temperature
Cycle
High Temperature
Storage
High Temperature
High Humidity
Storage
Low Temperature
Storage
Operating
Endurance Test
High Temperature
High Humidity
Life Test
High Temperature
Life Test
Low Temperature
Life Test
ESD(HBM)
EIAJ ED-4701
EIAJ ED-4701
EIAJ ED-4701
EIAJ ED-4701
EIAJ ED-4701
Internal
Reference
Internal
Reference
Internal
Reference
Internal
Reference
MIL-STD-
883D
T_a =-40^oC (30MIN) ~ 100^oC (30MIN)
T_a =-40^oC (30MIN) ~ 25^oC (5MIN)
~ 100^oC (30MIN) ~ 25^oC (5MIN)
T_a =100^oC
T_a =85^oC, RH=85%
T_a =-40^oC
T_a =25^oC, I_F =30mA
T_a =85^oC, RH=85%, I_F =15mA
T_a =100^oC, I_F =5mA
T_a =-40^oC, I_F =20mA
1KV at 1.5kΩ; 100pF
Duration
/ Cycle
100 Cycle
100 Cycle
1000
Hours
1000
Hours
1000
Hours
1000
Hours
300
Hours
1000
Hours
1000
Hours
3 Time
Number
of
Damage
0/22
0/22
0/22
0/22
0/22
0/22
0/22
0/22
0/22
0/22
Criteria for Judging the Damage
Item
Forward Voltage
Reverse Current
Luminous
Intensity
Symbol
V_F
I_R
I_V
Note : *1 USL : Upper Standard Level
*2 LSL : Lower Standard Level
Condition
I_F =20mA
V_R=5V
I_F =20mA
Criteria for Judgement
MIN
MAX
-
USL^*1 × 1.2
-
USL^*1 × 2.0
LSL^*2 × 0.5
-
Rev. 00
September 2010
www.seoulsemicon.com
서식번호 : SSC-QP-7-07-24 (Rev.00)