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BFC45 Datasheet, PDF (1/2 Pages) Seme LAB – 4TH GENERATION MOSFET
SEME
LAB
TO247–AD Package Outline.
Dimensions in mm (inches)
4.69 (0.185)
5.31 (0.209)
1.49 (0.059)
2.49 (0.098)
15.49 (0.610)
16.26 (0.640)
0.40 (0.016)
0.79 (0.031)
2.21 (0.087)
2.59 (0.102)
3.55 (0.140)
3.81 (0.150)
123
1.65 (0.065)
2.13 (0.084)
2.87 (0.113)
3.12 (0.123)
1.01 (0.040)
1.40 (0.055)
5.25 (0.215)
BSC
BFC45
4TH GENERATION MOSFET
N–CHANNEL
ENHANCEMENT MODE
HIGH VOLTAGE
POWER MOSFETS
VDSS
ID(cont)
RDS(on)
800V
9.0A
1.25Ω
Terminal 1 Gate
Terminal 3 Source
Terminal 2 Drain
ABSOLUTE MAXIMUM RATINGS (Tcase = 25°C unless otherwise stated)
VDSS
Drain – Source Voltage
ID
Continuous Drain Current
IDM
Pulsed Drain Current 1
VGS
Gate – Source Voltage
PD
TJ , TSTG
Total Power Dissipation @ Tcase = 25°C
Operating and Storage Junction Temperature Range
TL
Lead Temperature : 0.063” from Case for 10 Sec.
800
V
9.0
A
36
A
±30
V
240
W
–55 to 150
°C
300
STATIC ELECTRICAL RATINGS (Tcase = 25°C unless otherwise stated)
BVDSS
Characteristic
Drain – Source Breakdown Voltage
Test Conditions
VGS = 0V , ID = 250µA
IDSS
IGSS
VGS(TH)
Zero Gate Voltage Drain Current
(VGS = 0V)
Gate – Source Leakage Current
Gate Threshold Voltage
VDS = VDSS
VDS = 0.8VDSS , TC = 125°C
VGS = ±30V , VDS = 0V
VDS = VGS , ID = 1.0mA
ID(ON)
RDS(ON)
On State Drain Current 2
Drain – Source On State Resistance 2
VDS > ID(ON) x RDS(ON) Max
VGS = 10V
VGS = 10V , ID = 0.5 ID [Cont.]
1) Repetitive Rating: Pulse Width limited by maximum junction temperature.
2) Pulse Test: Pulse Width < 380µS , Duty Cycle < 2%
Min.
800
2
9
Typ. Max. Unit
V
250
µA
1000
±100 nA
4V
A
1.25 Ω
Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
Prelim. 4/94