K4M51163LC Datasheet, PDF (6/12 Pages) Samsung semiconductor – 8M x 16Bit x 4 Banks Mobile SDRAM in 54FBGA

K4M51163LC - R(B)N/G/L/F
Mobile SDRAM
AC OPERATING TEST CONDITIONS(VDD = 2.5V ± 0.2V, TA = -25 to 85°C for Extended, -25 to 70°C for Commercial)
Parameter
Value
Unit
AC input levels (Vih/Vil)
0.9 x VDDQ / 0.2
V
Input timing measurement reference level
0.5 x VDDQ
V
Input rise and fall time
tr/tf = 1/1
ns
Output timing measurement reference level
0.5 x VDDQ
V
Output load condition
See Figure 2
Output
500Ω
VDDQ
500Ω
VOH (DC) = VDDQ - 0.2V, IOH = -0.1mA
VOL (DC) = 0.2V, IOL = 0.1mA
30pF
Output
Figure 1. DC Output Load Circuit
Z0=50Ω
Vtt=0.5 x VDDQ
50Ω
30pF
Figure 2. AC Output Load Circuit
6
March 2006