DSA8300 Datasheet, PDF (6/26 Pages) List of Unclassifed Manufacturers – Digital Serial Analyzer Sampling Oscilloscope

Datasheet
Failure analysis – quickly identify fault
location
The 80E10B, with its 12 ps typical TDR rise time, provides superior
resolution enabling the fastest and most efficient fault isolation in package,
circuit board, and on-chip failure analysis applications.
IConnect^® Signal Integrity TDR and
S-parameter software
Operating on the DSA8300 TDR platform, IConnect^® S-parameters is the
most cost-effective and highest throughput approach for S-parameter
measurements in digital design, signal integrity analysis, and interconnect
compliance testing, providing as much as 50% cost savings compared to
similar bandwidth VNAs, and dramatically speeding up measurements.
You can also take advantage of the IConnect^® S-parameters command-line
interface, which automates the S-parameter measurements to the overall
suite of manufacturing tests you perform using your TDR instrument,
significantly reducing test time while increasing measurement repeatability.
The simplicity of S-parameter calibration using a reference (open, short, or
through), and an optional 50 Ω load makes measurements, fixture de-
embedding, and moving the reference plane a snap. Touchstone file format
output enables easy S-parameter file sharing for further data analysis and
simulations.
Tektronix offers several true-differential TDR modules, which in
combination with IConnect^® offers S-parameter measurements up to
50 GHz with up to –70 dB of dynamic range. This performance exceeds
requirements for serial data analysis, digital design, and signal integrity
applications, resolving down to 1% (–40 dB) accuracy of crosstalk, while
electrical compliance testing masks typically call for measurements in the –
10 to –30 dB range.
IConnect^® software lets you:
Quickly and easily generate SPICE and IBIS models for your PCBs,
flex boards, connectors, cables, packages, sockets, and I/O buffer
inputs directly from TDR/T or VNA S-parameter measurements
Display eye diagram degradation, jitter, loss, crosstalk, reflections, and
ringing in your digital system
Substantially simplify the signal integrity analysis of the interconnect
link, equalization and emphasis component design, and analysis of the
interconnect link with transmitter and receiver
IConnect^® Linear Simulator lets the designer link several interconnect
channels together to evaluate the total time, frequency domain
performance, and eye diagram of the overall channel
For more information regarding the IConnect^® software applications, see
the IConnect^® Signal Integrity, TDR, and S-Parameter SW – 80SICMX •
80SICON • 80SSPAR datasheet.
Measurement and analysis tools for optical
testing applications
The DSA8300 includes a wide variety of measurement and analysis tools
which specifically address optical testing applications. In addition to the
standard amplitude and timing parametric measurements (such as rise/fall
times, amplitude, RMS jitter, RMS noise, frequency, period, etc.), the
measurement suite for the DSA8300 includes measurements specifically
tailored to measuring optical signals (average optical power, extinction
ratio, eye height, eye width, optical modulation amplitude (OMA), etc.). For
a complete list of measurements, see the Measurement section of this
datasheet.
The DSA8300 also includes standard compliance testing masks for all of
the common optical standards from 155 Mb/s to 100 Gb/s. The DSA8300
mask testing system includes the ability to automatically fit standard and
user masks to data acquired into a waveform database. The mask test
system can also automatically determine the mask margin based either on
the total # of mask violations or the "hit ratio" of mask violation to the
number of samples acquired in the mask test unit interval. Users can also
create their own masks for automated mask testing. Histograms and cursor
measurements are also available to analyze optical signals acquired by the
DSA8300.
Finally, the 80SJNB applications support complete jitter, noise, and BER
analysis for optical signals. The advanced version of this software (Option
JNB01) supports evaluating the emphasis and equalization on impaired
signals.
Sampling modules
High speed optical test solutions
The DSA8300 with its highly configurable mainframe and a wide variety of optical modules provide complete optical test solutions with superior system
fidelity from 125 Mb/s to 100 Gb/s and beyond. The modules cover a range of wavelengths for both single- and multi-mode fibers. Each module can be
optionally configured with several selectable Optical Reference Receiver (ORR) filters and/or a full bandwidth path. Each module also supports fully
calibrated clock recovery solutions (whether integrated into the module or through a data pick-off routed to an external clock recovery module or stand-alone
clock recovery instrument).
See the Optical sampling modules table for a brief description of each available optical sampling module. See the Optical sampling module selection guide
table for key specifications for each module. For more complete information on these modules, see the Optical Sampling Modules – 80C07B • 80C08D •
80C10C • 80C11B • 80C12B• 80C14 • 80C15 datasheet.
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