R1131 Datasheet, PDF (9/24 Pages) RICOH electronics devices division – R1131

R1131Dxx2 (HSON-6) is the discontinued product. As of June in 2016.
R1131x
TEST CIRCUIT
VDD
OUT
R1131x
C1
Series
C2
IOUT VOUT
GND
V
ISS
A
C1
VDD
OUT
OUT
R1131x
Series
C2
GND
CE ⋅ CE
∗ C1=C2= Tantalum1.0μF (VOUT<1.0V)
C1=C2=Ceramic1.0μF (VOUT ^>= 1.0V)
Standard Test Circuit
CE ⋅ CE
∗ C1=C2=Tantalum1.0μF (VOUT<1.0V)
C1=C2=Ceramic1.0μF (VOUT ^>= 1.0V)
Supply Current Test Circuit
Pulse
Generator
P.G
VDD
OUT
R1131x
Series
GND
C2
IOUT
CE ⋅ CE
∗ C2=Tantalum1.0μF (VOUT<1.0V)
C2=Ceramic1.0μF (VOUT ^>= 1.0V)
Ripple Rejection, Line Transient Response
Test Circuit
VDD
OUT
R1131x
C1
Series
C2
GND
IOUTa IOUTb
CE ⋅ CE
∗ C1=C2=Tantalum1.0μF (VOUT<1.0V)
C1=C2=Ceramic1.0μF (VOUT ^>= 1.0V)
Load Transient Response Test Circuit
VDD
OUT
R1131x
C1
Series
C2
GND
Pulse
Generator
CE ⋅ CE
IOUT
∗ Input signal waveform
to CE pin is shown below.
Set VOUT
+1.0V
0V
∗ C1=C2=Tantalum1.0μF (VOUT<1.0V)
C1=C2=Ceramic1.0μF (VOUT ^>= 1.0V)
Turn on Speed with CE pin Test Circuit
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