HD74LV00A Datasheet, PDF (6/9 Pages) Hitachi Semiconductor – Quad. 2-input NAND Gates

HD74LV00A
Test Circuit
Measurement point
C_L^*
Note: C_L includes the probe and fig capacitance.
• Waveform − 1
Input
t_r
10%
90%
50% VCC
t_PLH
t_f
90%
50% VCC
10%
t_PHL
In phase output
t_PHL
50% VCC
50% VCC
t_PLH
Out of phase output
50% VCC
50% VCC
V_CC
0V
V_OH
V_OL
V_OH
V_OL
Notes: 1. Input waveform: PRR ≤ 1 MHz, Zo = 50 Ω, t_r ≤ 3 ns, t_f ≤ 3 ns
2. The output are measured one at a time with one transition per measurement.
Rev.3.00, May 20, 2004, page 6 of 8