HD74LV00A Datasheet, PDF (4/9 Pages) Hitachi Semiconductor – Quad. 2-input NAND Gates

HD74LV00A
DC Electrical Characteristics
Ta = –40 to 85°C
Item
Symbol V_CC (V)*
Min
Typ Max
Unit Test Conditions
Input voltage
V_IH
V_IL
Output voltage
V_OH
V_OL
Input current
I_IN
Quiescent supply I_CC
current
2.0
1.5
——
2.3 to 2.7
3.0 to 3.6
4.5 to 5.5
V_CC× 0.7
V_CC× 0.7
V_CC× 0.7
——
——
——
2.0
—
— 0.5
2.3 to 2.7 —
3.0 to 3.6 —
4.5 to 5.5 —
— V_CC× 0.3
— V_CC× 0.3
— V_CC× 0.3
Min to Max V_CC – 0.1 — —
2.3
2.0
——
3.0
2.48
——
4.5
3.8
——
Min to Max —
— 0.1
2.3
—
— 0.4
3.0
—
— 0.44
4.5
—
— 0.55
0 to 5.5
—
— ±1
5.5
—
— 20
V
V
I_OH = –50 µA
I_OH = –2 mA
I_OH = –6 mA
I_OH = –12 mA
I_OL = 50 µA
I_OL = 2 mA
I_OL = 6 mA
I_OL = 12 mA
µA V_IN = 5.5 V or GND
µA V_IN = V_CC or GND, I_O = 0
Output leakage
I_OFF
0
current
—
—5
µA V_I or V_O = 0 V to 5.5 V
Input capacitance C_IN
3.3
—
3.3 —
pF V_I = V_CC or GND
Note: For conditions shown as Min or Max, use the appropriate values under recommended operating conditions.
Switching Characteristics
Item
Propagation
delay time
Symbol
t_PLH
t_PHL
Ta = 25°C
Min Typ
— 7.1
— 9.6
Ta = –40 to 85°C
Max Min
Max
12.9 1.0
15.0
16.6 1.0
20.0
Test
Unit Conditions
ns C_L = 15 pF
C_L = 50 pF
Item
Propagation
delay time
Symbol
t_PLH
t_PHL
Ta = 25°C
Min Typ
— 5.0
— 6.9
Ta = –40 to 85°C
Max Min
Max
7.9 1.0
9.5
11.4 1.0
13.0
Test
Unit ^Conditions
ns C_L = 15 pF
C_L = 50 pF
Item
Propagation
delay time
Symbol
t_PLH
t_PHL
Ta = 25°C
Min Typ
— 3.6
— 4.9
Ta = –40 to 85°C
Max Min
Max
5.5 1.0
6.5
7.5 1.0
8.5
Test
Unit ^Conditions
ns C_L = 15 pF
C_L = 50 pF
V_CC = 2.5 ± 0.2 V
FROM TO
(Input) (Output)
A or B Y
V_CC = 3.3 ± 0.3 V
FROM TO
(Input) (Output)
A or B Y
V_CC = 5.0 ± 0.5 V
FROM TO
(Input) (Output)
A or B Y
Rev.3.00, May 20, 2004, page 4 of 8