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R32C152_15 Datasheet, PDF (133/136 Pages) Renesas Technology Corp – RENESAS MCU
Revision History
R32C/152 Group Datasheet
Rev.
1.20
Date
Page
Description
Summary
102 • Changed typical and maximum values for “fSO(PLL)” in Table 5.13;
Added values for “|fLOCK|” and “|fUNLOCK|”
104 • Changed expressions “CS0” and “A23 to A0, BC3 to BC0” in Figure
5.5 to “Chip select” and “Address”, respectively
Appendix 1. Package Dimensions
130 • Added a seating plane to the drawing of package dimension
Aug 07, 2013 — Fourth edition released
This manual in general
— • Changed document number “REJ03B0231-0110” to
“R01DS0073EJ0120”
Chapter 1. Overview
— • Modified wording and enhanced description in this chapter
1
• Modified expression “I2C” in line 9 of 1.1 to “I2C-bus interface”
2
• Modified expressions “Main clock oscillator stop/re-oscillation
detection”, “calculation transfer”, “chained transfer”, and “inputs/
outputs” in Table 1.1 to “Main clock oscillator stop/restart detection”,
“calculation result transfer”, “chain transfer”, and “I/O ports”,
respectively
8, 10 • Changed the order of timer pins for pin no. 36 in Table 1.4 and pin nos.
79 and 81 in Table 1.6
13 • Modified expression “I2C bus” in Table 1.9 to “I2C-bus”
Chapter 2. CPU
— • Modified wording and enhanced description in this chapter
16 • Corrected a typo “R3R0” in line 3 of 2.1.1 to “R3R1”
Chapter 3. Memory
— • Modified wording and enhanced description in this chapter
Chapter 4. SFRs
25, 26, • Changed hexadecimal format of reset values for registers GiBCR0 in
28, 31 Tables 4.6, 4.7, 4.9 and 4.12 to binary
34 • Changed register name “Increment/Decrement Counting Select
Register” in Table 4.15 to “Increment/Decrement Select Register”
47 • Added the missing address “044E40h” to Table 4.28
61, 62, • Changed register name “CANi Acceptance Mask Register k” in Tables
75, 76, 4.42, 4.43, 4.56, 4.57, 4.70, and 4.71 to “CANi Mask Register k”
89, 90
64, 78, • Corrected reset value “XXXX XX00b” for CiMSMR register in Tables
92
4.45, 4.59, and 4.73 to “0000 0000b”
Chapter 5. Electrical Characteristics
— • Modified wording and enhanced description in this chapter
100, 101 • Changed expression “Programming and erasure endurance of flash
memory” in Tables 5.8 and 5.9 to “Program/erase cycles”; Changed
its unit “times” to “Cycles”
A- 3