PO100HSTL11A Datasheet, PDF (2/6 Pages) Potato Semiconductor Corporation – 1 to 2 Differential Clock/Data Fanout Buffer

PO100HSTL11A
1 to 2 Differential Clock/Data Fanout Buffer
02/11/07
2.4V -3.6V Differential inputs to HSTL outputs Clock Buffer
Maximum Ratings
Description
Max
Storage Temperature
-65 to 150
Operation Temperature -40 to 85
Operation Voltage
-0.5 to +4.6
Input Voltage
-0.5 to Vcc
Output Voltage
-0.5 to Vcc+0.5
Unit
°C
°C
V
V
V
Note:
stresses greater than listed under
Maximum Ratings may cause
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
Pin Characteristics
Symbol
C_IN
R_PULLUP
R_PULLDOWN
Parameter
Input Capacitance
Input Pullup Resistor
Input Pulldown Resistor
Test Conditions
Minimum
Typical
4
88
88
Maximum
Units
pF
KΩ
KΩ
DC Electrical Characteristics
Symbol
Description
Test Conditions
VOH ^{Output High voltage Vcc=3V Vin=VIH or VIL, IOH= -12mA}
VOL ^{Output Low voltage Vcc=3V Vin=VIH or VIL, IOH=12mA}
VIH
VIL
IIH
IIL
Input High voltage
Input Low voltage
Input High current
Input Low current
Guaranteed Logic HIGH Level (Input Pin)
Guaranteed Logic LOW Level (Input Pin)
Vcc = 3.6V and Vin = Vcc
Vcc = 3.6V and Vin = 0V
VIK ^{Clamp diode voltage Vcc = Min. And IIN = -18mA}
Min Typ Max Unit
2.4 3 - V
- 0.3 0.5 V
2 - Vcc V
-0.5 - 0.8 V
- - 1 uA
- - -1 uA
- -0.7 -1.2 V
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, 25 °C ambient.
3. This parameter is guaranteed but not tested.
4. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
5. VoH = Vcc – 0.6V at rated current
2
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