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74HC_HCT125_15 Datasheet, PDF (9/17 Pages) NXP Semiconductors – Quad buffer/line driver; 3-state
NXP Semiconductors
74HC125; 74HCT125
Quad buffer/line driver; 3-state
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Test data is given in Table 9.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Load circuit for switching times
Table 9. Test data
Type
Input
74HC125
74HCT125
VI
tr, tf
VCC
6 ns
3V
6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74HC_HCT125
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 19 January 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
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