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TDA8354Q Datasheet, PDF (8/16 Pages) NXP Semiconductors – Full bridge current driven vertical deflection output circuit in LVDMOS
Philips Semiconductors
Full bridge current driven vertical deflection
output circuit in LVDMOS
Preliminary specification
TDA8354Q
SYMBOL
∆Gi(T)
PSRR
PARAMETER
current gain drift as function of
temperature
power supply rejection ratio
CONDITIONS
note 6
MIN. TYP. MAX. UNIT
−
−
10−4
/K
80
90
−
dB
Input stage
Ii(bias)
Ii(diff)(p-p)
signal bias current
differential mode input current
(peak-to-peak value) pin 11 or 12
Vi(diff)
Vi(cm)
differential mode input voltage
common mode input voltage
Flyback switch
note 7
Ii(diff) = 500 µA
Ii(bias) = 330 µA
−
330
500
µA
−
500
600
µA
−
0.75 −
V
0.95 1.15 1.35 V
Io(Vflb)
Vloss
output peak current
voltage loss (Vflb − Vo(A))
Guard circuit
t < 1.5 ms
Io = +1.6 A
−
−
±1.6 A
−
8
9
V
Io(guard)
output current
Vo(guard)
output voltage on pin 1
allowable voltage on pin 1
not active;
−
−
10
µA
Vo(guard) = 0 V
active; Vo(guard) = 4.5 V 1
−
2.5
mA
Io(guard) = 100 µA
5
6
7
V
maximum leakage
−
−
18
V
current = 10 µA
Notes
1. At Tj = 125 °C. The temperature coefficient of Vloss has a positive sign.
2. The linearity error is measured without S correction and based on the same measurement principle as performed on
the screen. The measuring method is as follows:
Divide the output signal into 22 equal time parts ranging from 1 to 22 inclusive. Measure the value of the voltage
across RM of two succeeding parts called one block (a) starting with part 2 and 3 (block 1) and ending with
part 20 and 21 (block 10). Thus parts 1 and 22 are unused. The equations for linearity error for adjacent blocks
(LEAB) and not adjacent blocks (LENAB) are given below:
LEAB = a----k----–---a-a---a--(-v-k---+----1--)-
LENAB = a----m----a---xa----–a---v-a----m----i-n-
3. Vo(A) + Vo(B) = VP. At the start of the scan this equation is one diode voltage less.
4. The V value within formulae relates to voltages at or between relative pin numbers, i.e. V9 to 5/V3 to 5 = voltage value
across pins 9 and 5 divided by voltage value across pins 3 and 5.
5. V2 to 5 AC short-circuited.
6. At V(ripple) = 500 mV (eff) at VP; measured across RM; f(ripple) = 50 Hz − 1 kHz.
7. Ii(bias) + Ii(diff) ≤ 800 µA and Ii(bias) − Ii(diff) ≥ 50 µA per pin.
1998 Sep 03
8