TDA8042M Datasheet, PDF (8/16 Pages) NXP Semiconductors – Quadrature demodulator

Philips Semiconductors
Quadrature demodulator
Product specification
TDA8042M
7. The specified noise figure is the maximum value obtained from I and Q channels noise measurement. The figure
holds for the maximum gain (G_VAGC = 0.5 V).
8. The specified intermodulation distortion is the minimum value obtained from intermodulation measurements in I and
Q channels. The specified value is the minimum distance between wanted signal and intermodulation products
measured at the output for a wanted output level of 0.8 V (peak-to-peak value).
9. The oscillator is tuned with an appropriate tank circuit designed for each frequency limit.
10. The drift of the oscillator frequency with temperature is defined for ∆T_amb = 25 °C. It is measured in the application
circuit (see Fig.4) with a temperature compensated tank circuit. The temperature compensation used for this
measurement is realized using the application which is depicted in Fig.3.
11. The phase noise is measured at the oscillator frequency (= 240 MHz). Due to the internal frequency doubler the
phase noise at the input of the mixers will be 6 dB worse.
12. Measured with a high impedance load (R_L > 5 kΩ) connected at pins 12 and 13.
13. The prescaler output spurious voltage at I and Q outputs are measured with respect to an output level of 800 mV
(peak-to-peak value).
14. Measured with an input signal f_i(RF) + 500 kHz (i.e. 480.5 MHz).
15. The load should be AC-coupled.
handbook, full pagewidth
to pin 15
TOKO ref.:
100 082 93278
to pin 16
8.2 pF
NP0
2.2 pF
NP0
6 pF
N470
1 pF
N470
MBH969
Fig.3 Temperature compensation circuit.
1997 Apr 11
8