SAA5244A Datasheet, PDF (8/32 Pages) NXP Semiconductors – Integrated VIP and teletext decoder IVT1.1

Philips Semiconductors
Integrated VIP and teletext decoder
(IVT1.1)
Product specification
SAA5244A
LIMITING VALUES
In accordance with the Absolute Maximum System (IEC 134)
SYMBOL
V_DD
V_I
V_O
I_O
I_IOK
T_amb
T_stg
V_stat
PARAMETER
supply voltage (all supplies)
input voltage (any input)
output voltage (any output)
output current (each output)
DC input or output diode current
operating ambient temperature range
storage temperature range
electrostatic handling
human body model (note 1)
MIN.
−0.3
−0.3
−0.3
−
−
−20
−55
−2000
MAX.
6.5
V_DD+0.5
V_DD+0.5
±10
±20
70
125
2000
UNIT
V
V
V
mA
mA
°C
°C
V
Note
1. The human body model ESD simulation is equivalent to discharging a 100 pF capacitor through a 1.5 kΩ resistor;
this produces a single discharge transient. Reference Philips Semiconductors test method UZW-B0/FQ-A302
(compatible with MIL-STD method 3015.7).
Failure Rate
The failure rate at T_amb = 55 °C will be a maximum of 1000 FITS (1 FIT = 1 x 10^−9 failures per hour).
March 1992
8