74F8965 Datasheet, PDF (8/11 Pages) NXP Semiconductors – 9-Bit address/data Futurebus transceiver, ADT

Philips Semiconductors FAST Products
9-Bit address/data Futurebus transceiver, ADT
Product specification
74F8965/74F8966
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
CONDITIONS¹
LIMITS
UNIT
MIN TYP² MAX
I_OH
High–level output current
B0 – B8
V_CC = MAX, V_IL = MAX, V_IH = MIN, V_OH = 2.1V
100 µA
IAMC (74F8966) V_CC = MAX, V_IL = MAX, V_IH = MIN, V_OH = 4.5V
100 µA
I_OFF
Power–off output current
B0 – B8
V_CC = 0.0V, V_IL = MAX, V_IH = MIN, V_OH = 2.1V
100 µA
IAMC (74F8966) V_CC = 0.0V, V_IL = MAX, V_IH = MIN, V_OH = 4.5V
V_OH
High-level output voltage
A0 – A8⁴
V_CC = MAX, V_IL = MAX, V_IH = MIN, I_OH = –3mA 2.4
A0 – A8⁴
V_CC = MIN,
I_OL = 24mA
100 µA
V_CC
V
0.50 V
V_OL
Low-level output voltage IAMC (74F8966) V_IL = MAX
I_OL = 48mA
0.50 V
B0 – B8
V_IH = MIN
I_OL = 100mA
0.75 1.0 1.10 V
V_IK
Input clamp voltage
V_CC = MIN, I_I = I_IK
OEB0, OEB1,
I_I
Input current at
OEA, LE, LS, V_CC = MAX, V_I = 7.0V
maximum input voltage
IAREQ
-1.2 V
100 µA
A0 – A8, B0 –
B8
V_CC = MAX, V_I = 5.5V
OEB0, OEB1,
OEA, LE, LS, V_CC = MAX, V_I = 2.7V
I_IH
High–level input current
IAREQ
B0 – B8
V_CC = MAX, V_I = 2.1V
OEB0, OEB1,
OEA, LE, LS, V_CC = MAX, V_I = 0.5V
I_IL
Low–level input current
IAREQ
B0 – B8
V_CC = MAX, V_I = 0.3V
1
mA
20 µA
100 µA
–100 µA
–100 µA
I_IH + I_OZH
Off–state output current,
high–level voltage applied
A0 – A8
V_CC = MAX, V_O = 2.7V
50 ^µA
I_IL + I_OZL
Off–state output current,
low–level voltage applied
V_CC = MAX, V_I = 0.5V
–50 ^µA
I_OS
Short circuit output
current³
A0 – A8 only
AO8
I_CCH
V_CC = MAX
V_CC = MAX
-60
-150 mA
80 140 mA
I_CC
Supply current (total)
I_CCL
V_CC = MAX, V_IL = 0.5V
85 145 mA
I_CCZ
75 100 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold tech-
niques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a
high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence
of parameter tests, I_OS tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for V_IH =1.8V and V_IL = 1.3V.
December 19, 1990
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