SA5212A Datasheet, PDF (7/20 Pages) NXP Semiconductors – Transimpedance amplifier 140MHz

Philips Semiconductors
Transimpedance amplifier (140MHz)
Product specification
SA5212A
TEST CIRCUITS (Continued)
Typical Differential Output Voltage
vs Current Input
5V
I_IN (µA)
OUT +
IN DUT
OUT –
GND₁
GND₂
+
V_OUT (V)
–
1998 Oct 07
2.00
1.60
1.20
0.80
0.40
0.00
–0.40
–0.80
–1.20
–1.60
–2.00
–200
–160
–120
–80
–40
0
40
CURRENT INPUT (µA)
80
120
160
200
NE5212A TEST CONDITIONS
Procedure 1
R_T measured at 30µA
R_T = (V_O1 – V_O2)/(+30µA – (–30µA))
Where: V_O1 Measured at I_IN = +30µA
V_O2 Measured at I_IN = –30µA
Procedure 2
Linearity = 1 – ABS((V_OA – V_OB) / (V_O3 – V_O4))
Where: V_O3 Measured at I_IN = +60µA
V_O4 Measured at I_IN = –60µA
VOA + RT @ () 60mA) ) VOB
VOB + RT @ (* 60mA) ) VOB
Procedure 3
V_OMAX = V_O7 – V_O8
Where: V_O7 Measured at I_IN = +130µA
V_O8 Measured at I_IN = –130µA
Procedure 4
I_IN Test Pass Conditions:
V_O7 – V_O5 > 20mV and V₀₆ – V_O5 > 20mV
Where: V_O5 Measured at I_IN = +800µA
V_O6 Measured at I_IN = –80µA
V_O7 Measured at I_IN = +130µA
V_O8 Measured at I_IN = –130µA
Test Circuit 8
Figure 6. Test Circuit 8
SD00340
7